-Thesis "Asymptotic Theory of Empirical and Variational Bayes Learning," Tokyo Institute of Technology, March, 2006. -Articles in Journals S. Nakajima, S. Watanabe, "Variational Bayes Solution of Linear Neural Networks and its Generalization Performance," Neural Computation, vol.19, no.4, pp.1112-1153, 2007. S. Takamatsu, S. Nakajima, S. Watanabe, "Localized Bayes Estimation," IEICE Transactions, vol.J89-D, no.10, pp.2260-2268, 2006. S. Nakajima, S. Watanabe, "Generalization Performance of Subspace Bayes Approach in Linear Neural Networks," IEICE Transactions, vol.E89-D, no.3, pp.1128-1138, 2006. A. Sugaya, Y. Kanaya, S. Nakajima, T. Nagayama, N. Shiraishi, "Optical Alignment Optimizations for Reducing Wafer-Induced Shift", Jpn. J. Appl. Phys, vol.43, no.11A, pp. 7419-7426, 2004. -International Conference Proceedings S. Nakajima, S. Watanabe, "Generalization Error of Automatic Relevance Determination," To appear in Proceedings of International Conference on Artificial Neural Networks (ICANN2007), Porto, Portugal, September, 2007. S. Takamatsu, S. Nakajima, S. Watanabe, "Localized Bayes Estimation for Non-identifiable Models," Proceedings of International Conference on Neural Information Processing (ICONIP2006), pp.650-659, Hong Kong, China, October, 2006. S. Nakajima, S. Watanabe, "Analytic Solution of Hierarchical Variational Bayes in Linear Inverse Problem," Proceedings of International Conference on Artificial Neural Networks (ICANN2006), part II, LNCS 4132, pp.240-249, Athens, Greece, September, 2006. A. Sukegawa, S. Wakamoto, S. Nakajima, M. Kawakubo, N. Magome, "Overlay Improvement by Using New Framework of Grid Compensation for Matching," Proceedings of International Society for Optical Engineering (SPIE), San Jose, U.S.A., March, 2006. S. Nakajima, S. Watanabe, "Generalization Error and Free Energy of Linear Neural Networks in Variational Bayes Approach," Proceedings of International Conference on Neural Information Processing (ICONIP2005), pp.55-60, Taipei, Taiwan, October, 2005. S. Nakajima, S. Watanabe, "Generalization Error of Linear Neural Networks in an Empirical Bayes Approach," Proceedings of International Joint Conference on Artificial Intelligence (IJCAI2005), Edinburgh, U.K., pp.804-810, August, 2005. S. Nakajima, S. Watanabe, "Simulation Data Generation from Extended EGA Model and Optimization of Alignment Strategy for Lithography," Proceedings of International Symposium on Information Theory and its Applications (ISITA2004), Parma, Italy, pp.627-632, October, 2004. Y. Kanaya, S. Nakajima, "Development of Customer Assistance Software for Alignment Parameter Optimization," Proceedings of International Society for Optical Engineering (SPIE), Santa Clara, U.S.A., pp. 237-246, March, 2004. T. Nagayama, S. Nakajima, A. Sugaya, Y. Kanaya, A. Sukegawa, "New Method to Reduce alignment Error Caused by Optical System," Proceedings of International Society for Optical Engineering (SPIE), Santa Clara, U.S.A., pp.849-, March, 2003 S. Nakajima, Y. Kanaya, M. Li, T. Sugihara, A. Sukegawa, N. Magome, "Outlier Rejection with Mixture Models in Alignment," Proceedings of International Society for Optical Engineering (SPIE), Santa Clara, U.S.A., pp.1729-1741, March, 2003. A. Sugaya, Y. Kanaya, S. Nakajima, T. Nagayama, N. Shiraishi, "Innovative Optical Alignment Technique for CMP Wafers," Proceedings of International Society for Optical Engineering (SPIE), Santa Clara, U.S.A., pp.959-970, March, 2002. S. Nakajima, Y. Kanaya, A. Takahashi, K. Yoshida, H. Mizutani, "Improving the Measurement Algorithm for Alignment," Proceedings of International Society for Optical Engineering (SPIE), Santa Clara, U.S.A., pp.572-582, March, 2001. -Internal Conference Papers and Technical Reports (in Japan) S. Nakajima, S. Watanabe, "Difference between Variational Bayes and Shrinkage Estimation in Linear Inverse Problem," Proceedings of Workshop on Information-Based Induction Sciences (IBIS2006), vol.9, pp.298-303, November, 2006. S. Nakajima, S. Watanabe, "Analysis of Hierarchical Variational Bayes Approach in Linear Inverse Problem," Technical Report of IEICE, NC2005-117, pp.67-72, March, 2006. S. Watanabe, K. Watanabe, S. Nakajima, T. Hoshino, "Invitation to Variational Bayes Learning Theory" Proceedings of Workshop on Information-Based Induction Sciences (IBIS2005), vol.8, pp.275-280, November, 2005. S. Takamatsu, S. Nakajima, S. Watanabe, "Generalization Error of Localized Bayes Estimation in Reduced Rank Regression," Proceedings of Workshop on Information-Based Induction Sciences (IBIS2005), vol.8, pp.81-86, November, 2005. S. Nakajima, S. Watanabe, "Generalization Properties of Variational Bayes Approach in Linear Neural Networks," Proceedings of Workshop on Information-Based Induction Sciences (IBIS2005), vol.8, pp.87-92, November, 2005. S. Nakajima, S. Watanabe, "Analysis of Subspace Bayes Approach in Linear Neural Networks," Technical Report of IEICE, NC2005-49, pp.19-24, October, 2005. S. Nakajima, S. Watanabe, "Generalization Error of Variational Bayes Approach in Reduced Rank Regression," Technical Report of IEICE, NC2004-213, pp.117-122, March, 2005. S. Nakajima, S. Watanabe, "Generalization Error of an Empirical Bayes Approach," Proceedings of Workshop on Information-Based Induction Sciences (IBIS2004), vol.7, pp.28-33, November, 2004. S. Nakajima, S. Watanabe, "Generalization Error of the Hyperparameter Optimization Method," Technical Report of IEICE, NC2004-44,pp.7-12, July, 2004. S. Nakajima, Y. Kanaya, N. Magome, "Outlier Rejection with Mixture Models in Alignment for Lithography," Proceedings of Workshop on Information-Based Induction Sciences (IBIS2003), vol.6, pp.47-52, November, 2004. S. Nakajima, Y. Kanaya, N. Magome, "Outlier Rejection in Alignment for Lithography," Technical Report of IEICE, NC2003-32,pp.61-66, July, 2003. S. Nakajima, Y. Kanaya "Measurement Algorithm for Alignment in Lithography" Optics Japan, pp221-222, Tokyo, November, 2001. -Others S. Nakajima, S. Watanabe, "Generalization Performance of Variational Bayes in Bilinear Models," Seminar talk at Intelligent Data Analysis (IDA) Group (led by Prof. K. R. Mueller), Fraunhofer-FIRST, Berlin, Germany, September, 2006.